ALEXANDRIA, Va., June 16 -- United States Patent no. 12,309,365, issued on May 20, was assigned to Shanghai Bilibili Technology Co. Ltd. (Shanghai).
"Sample adaptive offset" was invented by Xiaobo Li (Shanghai) and Tianxiao Ye (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and an apparatus for sample adaptive offset, a device, and a medium are provided. An implementation is: obtaining a band value and a residual of each pixel in a target image; selecting a plurality of adjacent target pixels from the target image; and performing band information calculation operation for the plurality of adjacent target pixels, the band information calculation operation including: obtaining a maximum band ...