US Patent Issued to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION on Nov. 4 for "Electrical property measuring device including non-uniform microchannels" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,060, issued on Nov. 4, was assigned to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION (Seoul, South Korea).

"Electrical property measuring device including non-uniform microchannels" was invented by Sung Jae Kim (Seoul, South Korea), Sungjae Ha (Gyeonggi-do, South Korea) and Hyung Joo Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an electrical property measuring device capable of increasing reliability of evaluation of electrical properties of 3D structures such as living tissues and biomimetic structures and simplifying a measurement process by improving an ion concentration gradient caused by an ion concentration po...