US Patent Issued to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, INSTITUTE FOR BASIC SCIENCE on Feb. 25 for "Probe system for low-temperature high-precision heat transport measurement and measurement device including same" (South Korean, British Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,235,166, issued on Feb. 25, was assigned to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION (Seoul, South Korea) and INSTITUTE FOR BASIC SCIENCE (Daejeon, South Korea).

"Probe system for low-temperature high-precision heat transport measurement and measurement device including same" was invented by Je Geun Park (Seoul, South Korea), Ha Leem Kim (Seoul, South Korea) and Matthew John Coak (Coventry, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a probe system for low-temperature high-precision heat transport measurement, the probe system including a sample loader where a sample is loaded. In the probe system for low-temperature high-p...