US Patent Issued to SENTRONICS METROLOGY on Feb. 25 for "Device and method for measuring the profile of flat objects comprising unknown materials" (German Inventor)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,235,209, issued on Feb. 25, was assigned to SENTRONICS METROLOGY GMBH (Mannheim, Germany).

"Device and method for measuring the profile of flat objects comprising unknown materials" was invented by Bernd Srocka (Erfurt, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device for measuring the profile of the surface of a flat object of unknown materials, including an interferometry measuring system, ellipsometry measuring system, beam splitter for splitting a light beam of a light source into an interferometry light beam and an ellipsometry light beam, and an analysis unit designed to ascertain the profile height in the measured region...