US Patent Issued to Sentient Science on April 22 for "Systems and methods for defect detection and correction in additive manufacturing processes" (Minnesota, Indiana, New York, Pennsylvania Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,280,429, issued on April 22, was assigned to Sentient Science Corp. (Buffalo, N.Y.).

"Systems and methods for defect detection and correction in additive manufacturing processes" was invented by Jingfu Liu (Prior Lake, Minn.), Behrooz Jalalahmadi (Long Island City, N.Y.), Ziye Liu (West Lafayette, Ind.), Andrew Vechart (Minnetrista, Minn.) and Xiawa Wu (Erie, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method of additive manufacturing is disclosed herein which when run or performed form a product with a powder-based additive manufacturing device by adding sequential layers of material on top of one another. As each sequential layer of...