US Patent Issued to SEMITEC on Sept. 23 for "Deep temperature measuring device and deep temperature measuring method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,308, issued on Sept. 23, was assigned to SEMITEC Corp. (Tokyo).

"Deep temperature measuring device and deep temperature measuring method" was invented by Katsuhisa Taguchi (Tokyo) and Toshiyuki Nojiri (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a deep temperature measuring device and a deep temperature measuring method capable of measuring a deep temperature of a measured object with high precision, high accuracy, and high-speed responsiveness. The above-described problem is solved by a deep temperature measuring device comprising a thermosensitive part (Ts) that senses temperature, a measurement thin film thermistor capable o...