US Patent Issued to SEMITEC, National Institute of Technology, HIROSAKI UNIVERSITY on Dec. 2 for "Temperature measurement device, temperature measurement method, and temperature attenuation measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,131, issued on Dec. 2, was assigned to SEMITEC Corp. (Tokyo), National Institute of Technology (Tokyo) and HIROSAKI UNIVERSITY (Aomori, Japan).

"Temperature measurement device, temperature measurement method, and temperature attenuation measurement method" was invented by Shigenao Maruyama (Aomori, Japan), Takahiro Okabe (Aomori, Japan), Yuya Iseki (Aomori, Japan), Takashi Nonaka (Aomori, Japan), Takuma Kogawa (Aomori, Japan), Yasushi Hosokawa (Aomori, Japan), Yutaro Tabata (Tokyo), Tadashi Matsudate (Tokyo), Toshinori Nakajima (Tokyo), Masaya Higashi (Tokyo) and Manabu Orito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature measure...