US Patent Issued to SEMIGHT INSTRUMENTS on Feb. 18 for "Wafer-level semiconductor high-voltage reliability test fixture" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,603, issued on Feb. 18, was assigned to SEMIGHT INSTRUMENTS Co. LTD (Suzhou, China).

"Wafer-level semiconductor high-voltage reliability test fixture" was invented by Zhe Lian (Suzhou, China), Pengsong Xu (Suzhou, China), Jianjun Huang (Suzhou, China) and Haiyang Hu (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wafer-level semiconductor high-voltage reliability test fixture is provided. The test fixture includes: a first insulation plate, a first circuit board, and a second insulation plate. A target object is disposed between the first circuit board and the second insulation plate. A side of the first circuit board facing the targ...