US Patent Issued to Semiconductor Energy Laboratory on Oct. 14 for "Device detecting abnormality of secondary battery, abnormality detection method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,862, issued on Oct. 14, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Kanagawa-ken, Japan).

"Device detecting abnormality of secondary battery, abnormality detection method, and program" was invented by Kei Takahashi (Kanagawa, Japan) and Kouhei Toyotaka (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A secondary battery control system that conducts abnormality detection while predicting other parameters (internal resistance, SOC, and the like) with high accuracy is provided. A difference between an observation value (voltage) at a certain point in time and a voltage that is estimated using a prior-state variable is sense...