US Patent Issued to Semiconductor Energy Laboratory on Nov. 4 for "Classification device, image classification method, and pattern inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,533, issued on Nov. 4, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Japan).

"Classification device, image classification method, and pattern inspection device" was invented by Tatsuya Okano (Kanagawa, Japan) and Ryo Nakazato (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A novel classification device is provided. The classification device includes a memory unit, a processing unit, and a classifier. A plurality of pieces of image data and a discriminative model are stored in the memory unit. Each of the plurality of pieces of image data is image data determined to contain a defect. The discriminative model includes an inp...