US Patent Issued to Semiconductor Energy Laboratory on April 1 for "Protection circuit for secondary battery and abnormality detection system of secondary battery" (Japanese Inventors)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,266,957, issued on April 1, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Atsugi, Japan).

"Protection circuit for secondary battery and abnormality detection system of secondary battery" was invented by Toshiyuki Isa (Kanagawa, Japan), Takayuki Ikeda (Kanagawa, Japan), Kei Takahashi (Kanagawa, Japan) and Ryota Tajima (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The safety is ensured in such a manner that an abnormality of a secondary battery is detected, for example, a phenomenon that lowers the safety of the secondary battery is detected early and a warning is given to a user. A first protection circuit and a second prote...