US Patent Issued to SEMICONDUCTOR COMPONENTS INDUSTRIES on June 17 for "Built-in self test with current measurement for analog circuit verification" (Belgian Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,303, issued on June 17, was assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES LLC (Scottsdale, Ariz.).

"Built-in self test with current measurement for analog circuit verification" was invented by Francois Laulanet (Brussels) and Jorg Jos Daniels (Outgaarden, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "Illustrative integrated circuit devices are provided with built-in self test circuit designs and verification methods. One disclosed integrated circuit device includes: an analog circuit block configured to be powered by a current flow from a first power rail and an intermediate node; a current sensor configured to provide digital measurement...