US Patent Issued to SEMES on Sept. 9 for "Substrate inspecting unit and substrate treating apparatus including the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,412,258, issued on Sept. 9, was assigned to SEMES Co. LTD. (Chungcheongnam-do, South Korea).

"Substrate inspecting unit and substrate treating apparatus including the same" was invented by Ji Hoon Yoo (Gyeonggi-do, South Korea), Kwang Sup Kim (Chungcheongnam-do, South Korea), Jong Min Lee (Gyeonggi-do, South Korea), Yeon Chul Song (Seoul, South Korea), Jun Ho Oh (Gyeonggi-do, South Korea), Young Ho Park (Incheon, South Korea) and Myeong Jun Lim (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a substrate inspecting unit capable of reducing image data labeling work time through training image data set verification an...