US Patent Issued to Seiko Epson on Sept. 23 for "Defect discrimination apparatus for printed images and defect discrimination method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,802, issued on Sept. 23, was assigned to Seiko Epson Corp. (Tokyo).

"Defect discrimination apparatus for printed images and defect discrimination method" was invented by Mitsuhiro Yamashita (Matsumoto, Japan), Takahiro Kamada (Matsumoto, Japan), Naoki Hagihara (Shiojiri, Japan), Takuya Ono (Shiojiri, Japan) and Yuko Yamamoto (Shiojiri, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Prepare a learning model that has been trained to output similarity for each defect species by machine learning using a teacher image that is an image containing a defect occurring during printing and that is associated with a defect species in advance. Then, a tar...