US Patent Issued to SEIKO EPSON on Nov. 25 for "Abnormality determination method, control device, and non-transitory computer-readable storage medium storing program" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,483,681, issued on Nov. 25, was assigned to SEIKO EPSON Corp. (Tokyo).

"Abnormality determination method, control device, and non-transitory computer-readable storage medium storing program" was invented by Takashi Natori (Suwa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination method includes: acquiring first information indicating a state of a first display device configured to display a first portion of a first image in a first area of a display area that displays the first image; acquiring second information indicating a state of a second display device configured to display a second portion of the first image that is...