ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,588, issued on July 22, was assigned to SEIKO EPSON Corp. (Tokyo).
"Inertial measurement device and inertial measurement system" was invented by Fumikazu Otani (Azumino, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inertial measurement device includes: an inertial sensor; a first signal processing circuit; a second signal processing circuit; a first communication unit and a second communication unit configured to communicate with an external device; and a mode selection unit configured to select a processing mode from a plurality of modes including a first processing mode and a second processing mode. The first processing mode is a mode i...