US Patent Issued to SEIKO EPSON on Feb. 25 for "Measurement method, measurement device, measurement system, and measurement program" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,233,923, issued on Feb. 25, was assigned to SEIKO EPSON Corp. (Japan).

"Measurement method, measurement device, measurement system, and measurement program" was invented by Yoshihiro Kobayashi (Komagane, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount...