US Patent Issued to SEIKO EPSON on Dec. 16 for "Projector device, projector, supporting device, abnormality determination device, and abnormality determination method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,501,009, issued on Dec. 16, was assigned to SEIKO EPSON Corp. (Tokyo).

"Projector device, projector, supporting device, abnormality determination device, and abnormality determination method" was invented by Shinichi Wakabayashi (Suwa, Japan), Tatsuya Takahashi (Azumino, Japan), Hideyuki Yamada (Nagano-ken, Japan) and Yasuhiro Sudo (Chino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A projector device includes: a projector supported in a suspended state by a supporting device; a vibration generation device that generates a vibration acting on at least one of the supporting device and the projector; a vibration detection device that detects a vi...