US Patent Issued to SEIKO EPSON on Aug. 26 for "Circuit device and error detection method" (Canadian, Japanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,318, issued on Aug. 26, was assigned to SEIKO EPSON Corp. (Japan).

"Circuit device and error detection method" was invented by Yasutoshi Akiba (Chino, Japan) and Jeffrey Eric (Richmond, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit device includes a storage circuit, an image conversion circuit, and an error detection circuit. The storage circuit stores received first image data. The image conversion circuit executes an image conversion by a coordinate conversion on the first image data by outputting a reference coordinate indicating a pixel position on the first image data and outputting second image data based on pixel data that i...