US Patent Issued to SEIKO EPSON on Aug. 12 for "Measurement method, measurement device, measurement system, and measurement program" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,802, issued on Aug. 12, was assigned to SEIKO EPSON Corp. (Japan).

"Measurement method, measurement device, measurement system, and measurement program" was invented by Yoshihiro Kobayashi (Komagane, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method includes: an acceleration data acquisition step of acquiring acceleration data output from an accelerometer that observes an observation point of a structure when a first moving body moves on the structure; a speed vibration component calculation step of calculating a first speed vibration component by performing integration processing and filter processing on an acceleration base...