US Patent Issued to SEIKO EPSON on April 15 for "Method for determining quality of inspection data using machine learning model, information processing apparatus, and non-transitory computer readable storage medium storing computer program" (Japanese Inventor)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,699, issued on April 15, was assigned to SEIKO EPSON Corp. (Tokyo).

"Method for determining quality of inspection data using machine learning model, information processing apparatus, and non-transitory computer readable storage medium storing computer program" was invented by Hikaru Kurasawa (Matsumoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quality determination method includes: (a) generating a plurality of pieces of training data by classifying a plurality of pieces of non-defective product data into a plurality of classes; (b) executing learning of a machine learning model using the plurality of pieces of training data; (c) prepar...