US Patent Issued to SEIKO EPSON on April 15 for "Measurement method, measurement device, measurement system, and measurement program" (Japanese Inventor)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,542, issued on April 15, was assigned to SEIKO EPSON Corp. (Japan).

"Measurement method, measurement device, measurement system, and measurement program" was invented by Yoshihiro Kobayashi (Komagane, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method includes: generating first measurement data based on observation data of an observation point of a structure; generating second measurement data by performing filter processing on the first measurement data; calculating a first deflection amount of the structure; calculating a second deflection amount by performing filter processing on the first deflection amount; approximating th...