US Patent Issued to Seek Thermal on Nov. 25 for "Cost effective, mass producible temperature controlled thermal imaging calibration source" (California Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,824, issued on Nov. 25, was assigned to Seek Thermal Inc. (Goleta, Calif.).

"Cost effective, mass producible temperature controlled thermal imaging calibration source" was invented by William J. Parrish (Santa Barbara, Calif.), Andrew Duerner (Santa Barbara, Calif.), Brian Nehring (Santa Barbara, Calif.), Matt Buckley (Santa Barbara, Calif.) and Charles Meyer (Santa Barbara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature-controlled calibration source for thermal imaging that provides for extremely inexpensive, mass producible, field deployable thermal calibration in specific, relatively low temperature ranges, and in particular ...