ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,771, issued on April 8, was assigned to SEC Co. LTD. (Suwon-Si, South Korea).
"X-ray inspection device and x-ray inspection system" was invented by Jong Hui Kim (Suwon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection device is disclosed. The present X-ray inspection device includes an X-ray tube, a detector disposed so as to face the X-ray tube, and transfer devices, for simultaneous inspection of at least two objects to be inspected, transferring at least two objects to be inspected to an inspection position between the X-ray tube and the detector."
The patent was filed on Sept. 14, 2020, under Application No. 18/021...