US Patent Issued to SDT on March 11 for "Method for measuring states of time-bin qubits in a quantum cryptography key distribution system using a time-to-digital converter and a system for the same" (South Korean Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,249,994, issued on March 11, was assigned to SDT INC. (Seoul, South Korea).

"Method for measuring states of time-bin qubits in a quantum cryptography key distribution system using a time-to-digital converter and a system for the same" was invented by Jiwon Yune (Gwacheon-si, South Korea) and Byungkwon Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a quantum cryptography key distribution system. A receiving device of the system includes: a first single-photon detector outputting a data signal including a time-bin encoding pulse indicating a quantum signal; and a TDC receiving a predetermined reference timing sign...