ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,726, issued on June 17, was assigned to SCREEN Holdings Co. Ltd. (Kyoto, Japan) and Kyoto Prefectural Public University Corp. (Kyoto, Japan).
"Specimen analysis method and image processing method" was invented by Maki Hirai (Kyoto, Japan), Hiroshi Ogi (Kyoto, Japan), Shunta Ishihara (Kyoto, Japan), Takahiro Tsujikawa (Kyoto, Japan) and Kyoko Itoh (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An image processing using a plurality of specimen images obtained by successively applying a plurality of types of staining to a specimen to be evaluated and imaging the specimen after staining for at least two types of staining is performed. The ...