ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,265, issued on Jan. 28, was assigned to SCIDATEK INC. (Austin, Texas).
"Integrated thin optical beam scanner" was invented by Tomoyuki Izuhara (Pleasanton, Calif.), Junichiro Fujita (Los Altos, Calif.) and Louay Eldada (Austin, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical beam scanning semiconductor device includes 1xN electrically controlled, integrated optical switch matrix and specifically designed integrated optical grating output couplers at each of N output waveguides of 1xN switch. By selecting one of the N outputs of the 1xN switch as the output of the input optical signal, an optical output beam scans in free space. Varia...