ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,667, issued on July 1, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas).
"X-ray fluorescence spectroscopy analysis" was invented by Sergey Mikhailovich Makarychev-Mikhailov (Cambridge, Great Britain), Isabelle Atheaux (Cambridge, Great Britain) and Debora Campos de Faria (Cambridge, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "Multivariate machine learning (ML) techniques can be applied to an XRF spectra and mitigate matrix effects and enable simultaneous quantification of composition, even when markers elements or ions of interest are imperceptible in the XRF spectra. Physical (e.g., density) and chemical (e.g., tota...