US Patent Issued to SCANTECH (HANGZHOU) on March 25 for "Multi-mode three-dimensional scanning method and system" (Chinese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,595, issued on March 25, was assigned to SCANTECH (HANGZHOU) Co. LTD. (Hangzhou, China).

"Multi-mode three-dimensional scanning method and system" was invented by Jun Zheng (Hangzhou, China), Shangjian Chen (Hangzhou, China), Jiangfeng Wang (Hangzhou, China) and Lidan Zhang (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multi-mode three-dimensional scanning method includes: obtaining intrinsic parameters and extrinsic parameters of a calibrated camera in different scanning modes, and upon switching between the different scanning modes, triggering a change of parameters of the camera to the intrinsic parameters and the extrinsic p...