ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,501, issued on July 15, was assigned to SATYIELD INC. (Morgan Hill, Calif.).
"Versatile crop yield estimator" was invented by Yuval Sadeh (Kibbutz Maayan-Baruch, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for estimating crop yield of an analyzed area, which is a region of interest, according to which imagery data is acquired from one or more remotely sensed sources, using a remote sensing platform or one or more satellites. A remotely sensed LAI of the analyzed area is generated by fusing the acquired imagery data and the sowing date of the analyzed field is detected by processing the imagery data. The detected sowing date and a ...