US Patent Issued to SAP on Nov. 25 for "User acceptance test system for machine learning systems" (Indian, Singaporean Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,727, issued on Nov. 25, was assigned to SAP SE (Walldorf, Germany).

"User acceptance test system for machine learning systems" was invented by Atreya Biswas (Bangalore, India), Denny Jee King Gee (Singapore) and Srivatsan Santhanam (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and computer-readable storage media for receiving, by a ML application executing within a cloud platform, a first inference request, the first inference request including first inference data, transmitting, by the ML application, the first inference data to the UAT system within the cloud platform, retrieving, by the UAT system, a first ML ...