ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,884, issued on March 25, was assigned to SAP SE (Walldorf, Germany).
"Histogram with integrated distinct value sketches" was invented by Siomara Schulz (Walldorf, Germany), Guido Moerkotte (Walldorf, Germany) and Norman May (Walldorf, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are systems and methods for creating histograms with distinct value sketches integrated therein and for query processing based on the histograms with distinct value sketches. In one example, the method may include storing a histogram that comprises a representation of a bucket of data from a database and that includes a distinct value sketch with a distin...