US Patent Issued to SAP on June 17 for "Machine-learned model for duplicate crash dump detection" (Chinese, South Korean Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,448, issued on June 17, was assigned to SAP SE (Walldorf, Germany).

"Machine-learned model for duplicate crash dump detection" was invented by Hao Yang (Xi'an, China), Yang Xu (Xi'an, China), Yong Li (Xi'an, China) and Hyun Deok Choi (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an example embodiment, a machine learned model is utilized for identifying duplicate crash dumps. After a developer submits code, corresponding test cases are used to ensure the quality of the software delivery. Test failures can occur during this period, such as crashes, errors, and timeouts. Since it takes time for developers to resolve them, many d...