ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,517, issued on Sept. 30, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Thermal measurement of materials" was invented by Rohan Shirsat (Bangalore, India) and Ankur Agrawal (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A thermal measurement system includes a temperature-controlled chamber configured to house a Device Under Test (DUT) and a first temperature sensor to measure an external temperature of the DUT inside the temperature-controlled chamber. The thermal measurement system further includes a heating device for heating a test material outside the temperature-controlled chamber and a controller configured t...