US Patent Issued to Sandisk Technologies on Sept. 16 for "Memory testing flow set up with computational intelligence" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,816, issued on Sept. 16, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Memory testing flow set up with computational intelligence" was invented by Cuili Fu (Shanghai), Chengxue Huo (Shanghai), Xiaohu Liu (Shanghai) and Liang Li (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Technology for determining a test flow for testing memory during a production phase. The following are accessed: a list of test items with a number of candidate test item conditions for each test item, defects (e.g., bad blocks) detected by each test item condition, a list of benchmark defects (e.g., bad blocks), and judgement criteria. The defects (e....