US Patent Issued to Sandisk Technologies on Oct. 7 for "Enhanced bit error rate estimation scan process" (Chinese, American Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,686, issued on Oct. 7, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Enhanced bit error rate estimation scan process" was invented by Yichen Wang (Shanghai), Ming Wang (Shanghai), Anubhav Khandelwal (San Jose, Calif.) and Liang Li (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments disclosed herein are directed to a memory device, comprising control circuitry configured to: perform a broad voltage level range bit error rate estimation scan to identify an approximate optimal read reference voltage for a first string; perform a narrow voltage level range bit error rate estimation scan, using the approximate optimal rea...