US Patent Issued to Sandisk Technologies on Oct. 28 for "Separate peak current checkpoints for closed and open block read ICC countermeasures in NAND memory" (American, Israeli Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,531, issued on Oct. 28, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Separate peak current checkpoints for closed and open block read ICC countermeasures in NAND memory" was invented by Abu Naser Zainuddin (Milpitas, Calif.), Mark Shlick (Ganey-Tikva, Israel) and Jiahui Yuan (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "To reduce spikes in the current used during read operations by a system of multiple NAND memory dies operated in parallel, relative delays between the memory dies are introduced before high current sub-operations of the read. The occurrence of the primary current peak in the read operation can depe...