US Patent Issued to Sandisk Technologies on May 20 for "Data storage device and method for identifying a failing area of memory based on a cluster of bit errors" (American, Israeli Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,712, issued on May 20, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Data storage device and method for identifying a failing area of memory based on a cluster of bit errors" was invented by Eran Sharon (Rishon Lezion, Israel), Daniel J. Linnen (Naperville, Ill.), James Tom (Los Altos, Calif.), Nika Yanuka (Hadera, Israel), Tomer Eliash (Kfar Saba, Israel), Preston Thomson (Boise, Idaho) and Kirubakaran Periyannan (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "For bit errors caused by intrinsic cell variations, the bit errors are scattered across a page of memory. However, for bit errors caused by a physical iss...