ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,925, issued on March 25, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Data integrity check in non-volatile storage" was invented by Sugandha Sharma (Pleasanton, Calif.) and Mahim Raj Gupta (Milpitas, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Technology is disclosed herein for checking data integrity in a non-volatile storage system. The storage system may operate in a first mode in which a data integrity check is performed in closed blocks until more than an allowed number of word lines fail the data integrity check. After a closed block has more than the allowed number of the word lines fail the data integrity check, ...