ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,156, issued on June 17, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Write aggregation based on NAND wear level" was invented by Amir Segev (Meiter, Israel) and Shay Benisty (Beer Sheva, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Instead of using programmable block size aggregation, a lower multiple of page, and down to a page size aggregation is used. A bad block prediction unit in a controller is able to predict when a programmable block has a bad page. The bad block prediction unit can lower the aggregation size of a programmable block by monitoring the life cycle of the programmable block through bad block statistic ...