US Patent Issued to SANDISK TECHNOLOGIES on June 17 for "Scheme to fetch optimal read parameters by skipping invalid wordlines" (Indian Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,169, issued on June 17, was assigned to SANDISK TECHNOLOGIES INC (Milpitas, Calif.).

"Scheme to fetch optimal read parameters by skipping invalid wordlines" was invented by Darshan Pagariya (Bangalore, India) and Vishal Sharma (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A storage device updates optimal parameters associated with a Thermal Region Tag (TRT). A controller on the storage device assigns a TRT to blocks programmed at a given temperature range and updates an optimal TRT parameters by obtaining a set of representative wordlines and a set of indicative wordlines for a block assigned to the TRT. The controller performs a ...