ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,012, issued on July 15, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Mixed bitline lockout for QLC/TLC die" was invented by Xiang Yang (Santa Clara, Calif.) and Hua-Ling Cynthia Hsu (Fremont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Technology for mixed lockout verify. In a first programming phase, prior to a pre-determined data state completing verification, a no-lockout program verify is performed. After the pre-determined data state has completed verification, a lockout program verify is performed. The no-lockout verify may include charging all bit lines associated with the group to a sensing voltage to perform. The...