ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,848, issued on Dec. 2, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Read parameter zoning" was invented by Sixiang Zhao (Shanghai), Jing Yin (Shanghai), Ming Wang (Shanghai) and Liang Li (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "Technology for zoned read parameters. The read parameters may include read reference levels and/or offsets applied to base read reference levels. The memory system may assign memory cells located in a region (e.g., block) into zones based on a ranking of a target read level for each set of memory cells in the region. The memory system may assign word lines in a block into zones based on a rank...