US Patent Issued to Sandisk Technologies on Aug. 5 for "Non-volatile memory with faster post-erase defect testing" (California Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,960, issued on Aug. 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Non-volatile memory with faster post-erase defect testing" was invented by Sai Gautham Thoppa (San Jose, Calif.), Parth Amin (Livermore, Calif.) and Anubhav Khandelwal (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "As part of the erase operation for a memory block, one or more post-erase tests can be incorporated into the erase operation to see whether the block has grown any defects. After erasing a block and verifying the erase, the post-erase tests can be performed on the block. As these test involve biasing the block and performing a sensing op...