US Patent Issued to Sandisk Technologies on Aug. 5 for "Dynamic 1-tier scan for high performance 3D NAND" (California Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,954, issued on Aug. 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Dynamic 1-tier scan for high performance 3D NAND" was invented by Xiang Yang (Santa Clara, Calif.), Deepanshu Dutta (Fremont, Calif.) and Huai-yuan Tseng (San Ramon, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for executing a dynamic 1-tier scan on a memory array are provided. The memory array includes a plurality of memory cells organized into a plurality of sub-groups. The dynamic 1-tier scan includes executing an program loop in which cells of a first sub-group are counted to determine whether a numeric threshold is met, and, if the ...