ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,803, issued on Aug. 12, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Dynamic bitscan for non-volatile memory" was invented by Yidan Liu (Shanghai), Liang Li (Shanghai), Chao Xu (Shanghai) and Yingying Zhu (Shanghai).
According to the abstract* released by the U.S. Patent & Trademark Office: "Technology is disclosed herein for a dynamic bitscan. The dynamic bitscan may include performing a first bitscan of a first strict subset of memory cells. Then, based on results of the first bitscan, a determination is made whether to perform a second bitscan of a second strict subset of memory cells. Prior to the bitscan(s) a verify reference voltage may be applied to both ...