US Patent Issued to Sandisk Technologies on April 8 for "Vera detection method to catch erase fail" (California Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,417, issued on April 8, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Vera detection method to catch erase fail" was invented by Parth Amin (Livermore, Calif.), Sai Gautham Thoppa (San Jose, Calif.) and Anubhav Khandelwal (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Technology is disclosed herein for quickly determining which erase block is bad if there is a failure in parallel erasing a set of erase blocks. The erase blocks may be tested individually in response to a fail of the parallel multi-block erase. A voltage generator ramps up the erase voltage from a steady state magnitude towards a target magnitude. Th...