ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,161, issued on Sept. 9, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Chamber for measuring performance of antenna, system including the same, and operating method thereof" was invented by Ungryeol Lee (Suwon-si, South Korea), Myeonggeun Kim (Suwon-si, South Korea), Nohwan Park (Suwon-si, South Korea), Jongseo Park (Suwon-si, South Korea), Jaeyup Lee (Suwon-si, South Korea) and Yungil Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An anechoic antenna chamber includes: a holder on which a device under test (DUT) is configured to be mounted, at least one first antenna configured to radiate a first ...