ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,408,056, issued on Sept. 2, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Seoul, South Korea).
"Measurement method and device" was invented by Lisi Li (Beijing), Hong Wang (Beijing), Xiaoning Ma (Beijing) and Weiwei Wang (Beijing).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method is provided herein, which includes a first node transmitting a first message to a second node. The first message includes configuration related to a second measurement for assisting a first measurement. The second node starts the second measurement according to the configuration related to the second measurement, or obtains information used for aligning the fir...