US Patent Issued to SAMSUNG ELECTRONICS on Sept. 16 for "Sample holder for transmission electron microscope, sample analysis system including the same, and method for analyzing sample using the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,895, issued on Sept. 16, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Sample holder for transmission electron microscope, sample analysis system including the same, and method for analyzing sample using the same" was invented by Yeoseon Choi (Suwon-si, South Korea) and Donghoon Kwon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder for a transmission electron microscope may include: a column part that extends in a first direction; a stage configured to receive a sample, the stage disposed at a first end portion of the column part; a motor part disposed at a second end portion of the colu...